, /PRNewswire/ — Park Systems, a global leader in atomic force microscopy (AFM), announced that its Founder and CEO, Dr. Sang-il Park, will deliver the keynote address at the 32nd International Colloquium on Scanning Probe Microscopy (ICSPM32) in Sapporo, Japan on Nov 18, 2024. Dr. Park, a pioneer in AFM technology and its industrial applications, will present on the “Genesis and Evolution of AFM,” detailing its transformation from a laboratory invention to an indispensable tool for nanometrology in semiconductor manufacturing.
In his keynote, Dr. Park will explore the origins of AFM, tracing it back to its 1985 invention by G. Binnig, C.F. Quate, and Ch. Gerber at Stanford University, where Dr. Park himself studied under Prof. Quate. Dr. Park will delve into the groundbreaking innovations he led to commercialize AFM technology, such as the introduction of the flexure-based orthogonal scan system, non-contact mode operation in air, Z-servo optimization, and system automation. These breakthroughs not …